Removing admixtures from the melt of technical silicon in helium at low interelectrode current

A.V. Kaybichev, I.A. Kaybichev

KEYWORDS:

melt, silicon, admixtures, ion, multiatomicity

ABSTRACT:

The results for simultaneous melting of technical silicon samples in helium without  and with applied electrical field were presented. The interlectrode transfer of Fi, Ti, Ca, Al, B was estimated. The ions fraction in the passed electricity was determined. The formation of multiatom ions in the electrical field was proved; the dependence on the atomic mass of the elements are revealed.

 

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