Removing admixtures from the melt of technical silicon in helium at low interelectrode current

A.V. Kaybichev, I.A. Kaybichev


melt, silicon, admixtures, ion, multiatomicity


The results for simultaneous melting of technical silicon samples in helium without  and with applied electrical field were presented. The interlectrode transfer of Fi, Ti, Ca, Al, B was estimated. The ions fraction in the passed electricity was determined. The formation of multiatom ions in the electrical field was proved; the dependence on the atomic mass of the elements are revealed.


Leave a Reply

Your email address will not be published. Required fields are marked *